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KET/DME
Diagnostic methods in el. engineering
Guarantors: Doc. Ing. Jan Řeboun, Ph.D.
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- Dozvíte se, jaké typické vady vznikají při výrobě desek plošných spojů, při osazování a pájení součástek a provozu elektronických zařízení.
- Naučíte se tyto vady najít a diagnostikovat.
- Dozvíte se o nových mikroskopových a diagnostických technikách používaných ve výzkumu i v průmyslu.
- Vyzkoušíte si práci s digitálními mikroskopy a uvidíte moderní diagnostické přístroje a mikroskopy.
Last updated:
26.08.2021
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Information about course
| Brief information |
KET/DME
,
Diagnostic methods in el. engineering
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| Teaching |
Winter semester
,
Lecture 1 [Hours/Week]
Tutorial 2 [Hours/Week]
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| Completion |
Pre-Exam Credit,
3 credits,
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Course has neither
prerequisite
nor
preclusive
nor
recommended (for your information)
courses...
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Course annotation
KET/DME
-IS/STAG
| The aim of the course is to introduce methods used for diagnostics of materials, substrates, electronic components and assemblies to students. The course is mainly focused on methods of optical, fluorescence and confocal microscopy, including methods used to increase contrast. The advanced methods of electron microscopy, scanning microscopy, ultrasound microscopy and X-ray microscopy including computed tomography will be also presented to students. Students will be introduced in the field of spectroscopy and X-ray fluorescence, enabling determination of elemental composition of materials. They will also be acquainted with the methods for the preparation of the materialography cross-sections. Students will learn and practically try procedures for the diagnostic of typical defects of electronic devices, including evaluation of defects of electronic elements and assemblies according to the IPC standard. |
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